Gallium Focused Ion Beam (Ga-FIB) Lecture: Principles, Techniques & Applications

The KNI's Ga-FIB Microscopy lecture, presented by Matthew Sullivan Hunt, PhD. A lectures on He/Ne-FIB Microscopy will follow next week. Also see the SEM lecture (https://youtu.be/XFcnBEiFEv4).

Download the lecture slides (with complete slide notes) from the KNI's Box Directory, https://bit.ly/2O5sN6e. Different versions of each microscopy lecture exist there, including this lecture version with videos embedded, and .pptx & .pdf versions without the videos but with several more slides (this lecture version has been purposely condensed to fit into one hour).

Download the KNI Microscopy Handouts discussed in the video:
Ga-FIB Concepts: https://bit.ly/30XPSwZ
SEM & Ga-FIB Alignments: https://bit.ly/38LoTaA
SEM Concepts: https://bit.ly/2Grnp95
He- & Ne-FIB Concepts: https://bit.ly/2O45j14
He- & Ne-FIB Alignments: https://bit.ly/3aMQvOj
Guide to Optimizing SEM Images: https://bit.ly/2RxQy8Z

Note that all of the KNI's microscopy resources can be found in the Box directory (https://bit.ly/2uFnqne) and on individual instrument pages on the KNI Lab wiki (https://lab.kni.caltech.edu/index.php...).
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Disclaimer: This video is intended to serve as supplemental information and cannot replace in-person instrument training. Microscope operators are encouraged to consider which parameter setting is most suitable for their measurements. Caltech and KNI are not responsible for how the presented information is translated for use in other facilities.

For information or questions about this video, contact kni@caltech.edu