Scanning Electron Microscopy (SEM) Lecture: Principles, Techniques & Applications

The KNI's Scanning Electron Microscopy lecture, presented by Matthew Sullivan Hunt, PhD (with an updated video intro). Lectures on Ga-FIB (https://youtu.be/3eSzisbNcGo) and He/Ne-FIB Microscopy (https://youtu.be/JXS3K8G2CVY) are also available.

Download the lecture slides (with complete slide notes) from the KNI's Box Directory, https://bit.ly/2O5sN6e. Different versions of each microscopy lecture exist there, including this lecture version with videos embedded, and .pptx & .pdf versions without the videos but with several more slides (this lecture version has been condensed to fit into one hour).

Download the KNI Microscopy Handouts discussed in the video:
SEM Concepts: https://bit.ly/2Grnp95
SEM & Ga-FIB Alignments: https://bit.ly/38LoTaA
Guide to Optimizing SEM Images: https://bit.ly/2RxQy8Z
Ga-FIB Concepts: https://bit.ly/30XPSwZ
He- & Ne-FIB Concepts: https://bit.ly/2O45j14
He- & Ne-FIB Alignments: https://bit.ly/3aMQvOj

Note that all of the KNI's microscopy resources can be found in the Box directory (https://bit.ly/2uFnqne) and on individual instrument pages on the KNI Lab wiki (https://lab.kni.caltech.edu/index.php/Equipment_List#Microscopy).
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Disclaimer: This video is intended to serve as supplemental information and cannot replace in-person instrument training. Caltech and KNI are not responsible for how the presented information is translated for use in other facilities.

For information or questions about this video, contact kni@caltech.edu